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search Vie searchsearch 2010 Mona search[14]當探針以小距離（< 100 nm）掃描樣品表面時, 檢查到的不僅有磁力，還有原子力和靜電力。 提升高度法通過如下手段提高磁力的精確度:
- 首先，各條掃描線測量生成剖面。探針的測的的是樣品接近於AFM測量的結果。
- 提升磁性探針高度，離樣品更遠一些。
- 重複測量, 從中提取出磁性信號.[15]
[編輯] 操作模式
[編輯] 靜態（DC）模式
[編輯] 動態（AC）模式
[編輯] 參考文獻
- ^ 1.0 1.1 D.A. Bonnell, Scanning Probe Microscopy and Spectroscopy. 7. 2. Wiley-VCH. 2000. ISBN 047124824X.
- ^ D. Jiles. 15. Introduction to Magnetism and Magnetic Materials. 2. Springer. 1998. ISBN 3540401865.
- ^ L. Abelmann, S. Porthun, et al.. Comparing the resolution of magnetic force microscopes using the CAMST reference samples. J. Magn. Magn. Mater.. 1998, 190: 135–147. doi:10.1016/S0304-8853(98)00281-9. Bibcode: 1998JMMM..190..135A.
- ^ Nanoscan AG, Quantum Leap in Hard Disk Technology
- ^ 5.0 5.1 H. Hopster, and H.P. Oepen, Magnetic Microscopy of Nanostructures. 11-12. Springer. 2005.
- ^ M. De Graef, and Y. Zhu. 3. Magnetic Imaging and Its Applications to Materials: Experimental Methods in the Physical Sciences, 36. Academic Press. 2001. ISBN 0124759831.
- ^ Magnetic Force Microscopy
- ^ Y. Martin and K. Wickramasinghe. Magnetic Imaging by Force Microscopy with 1000A Resolution. Appl. Phys. Lett.. 1987, 50 (20): 1455–1457. doi:10.1063/1.97800. Bibcode: 1987ApPhL..50.1455M.
- ^ U. Hartmann. Magnetic Force Microscopy. Annu. Rev. Mater. Sci.. 1999, 29: 53–87. doi:10.1146/annurev.matsci.29.1.53. Bibcode: 1999AnRMS..29...53H.
- ^ History of Probing Methods
- ^ L. Gao, L.P. Yue, T. Yokota, et al.. Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images. IEEE Transactions on Magnetics. 2004, 40 (4): 2194–2196. doi:10.1109/TMAG.2004.829173. Bibcode: 2004ITM....40.2194G.
- ^ A. Winkler, T. Mühl, S. Menzel, et al.. Magnetic Force Microscopy Sensors using Iron-filled Carbon Nanotubes. J. Appl. Phys.. 2006, 99 (10): 104905. doi:10.1063/1.2195879. Bibcode: 2006JAP....99j4905W.
- ^ K. Tanaka, M. Yoshimura, and K. Ueda. High-Resolution Magnetic Force Microscopy Using Carbon Nanotube Probes Fabricated Directly by Microwave Plasma-Enhanced Chemical Vapor Deposition. J. NanoMaterials. 2009, 2009: 147204. doi:10.1155/2009/147204.
- ^ Magnetic Force Microscopy (MFM) manual
- ^ I. Alvarado, "Procedure to Perform Magnetic Force Microscopy (MFM) with VEECO Dimension 3100 AFM", NRF, 2006
[編輯] 外部連結
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